反应磁控溅射制备TiO2和Nb2O5混合光学薄膜

利用反应磁控溅射技术在BK-7基片上制备了二氧化钛和五氧化二铌均匀混合的光学薄膜.薄膜的内部微结构、表面形貌、化学成分比例以及光学性质等用X射线衍射、高分辨扫描电子显微镜、原子力显微镜、X射线光电子能谱和紫外可见近红外分光光度计进行研究；发现制备的薄膜为非晶结构，薄膜的表面平整、内部结构致密，不存在柱状结构或结晶颗粒的缺陷，TiO2与Nb2O5的成分比例大致是1∶1.54.从光学透射光谱计算的折射率和消光系数显示，在550 nm波长处的折射率为2.34，消光系数为2.0×10－4.结果表明制备的薄膜是TiO2和Nb2O5均匀混合的高质量光学薄膜.     

颜色视觉匹配中明度阈值的评价

为了对颜色视觉匹配中的明度阈值特性进行评价,采用在阴极射线管显示器上获得的颜色刺激,在5个不同明度的中性色背景下,标准刺激的明度L*从5到95以5个CIELAB单位为变化步长,共对19个不同明度的中性标准颜色进行视觉匹配实验。通过对实验结果的处理和分析,验证了关于颜色刺激视觉辨别明度阈值与背景明度之间相关性的韦伯法则和crispening效应,同时利用颜色视觉匹配数据对基于CIELAB的相关色差公式进行了评价和比较,CIEDE2000具有最好的明度差预测性能,CMC次之,CIELAB和CIE94最差。     

两种方法制备ITO薄膜的红外特性分析

比较了用电束加热蒸发法和直流磁控溅射法制备的氧化锡铟(ITO)薄膜在红外波段的光学特性实验发现,通过直流磁控溅射在常温下制备的ITO薄膜在红外波段折射率稳定、消光系数小,比电子束加热蒸发制备的膜有较高的透过率在波长1550nm附近的透过率可达86%以上,消光系数约为004,方电阻最低为100Ω/□.     

Soliton interaction under the influence of higher-order effects

In this paper, we present exact N-soliton solution by employing simple, straightforward Darboux transformation based on the Lax pair for Hirota equation, a higher-order nonlinear Schrödinger (HNLS) equation. As examples, one- and two-soliton solutions in explicit forms are given and their properties are also analyzed. A bound solution without interaction will be theoretically predicted if one can adjust frequency shift for each soliton appropriately. Further, we obtain the approximate eigenvalues by employing two-soliton solution and discuss analytically the interaction between neighboring solitons under the influence of the higher-order effects. It is shown that the combined effects of the higher-order effects can restrain the interaction between neighboring solitons to some extent. The results are proved by directly solving HNLS equation numerically.     

Fiber torsion sensor demodulated by a high-birefringence fiber Bragg grating

A new high-birefringence (Hi-Bi) fiber torsion sensor demodulated by a Hi-Bi fiber Bragg grating (FBG) is proposed in this study. The twisted Hi-Bi fiber sensor characteristics are analyzed using the Jones matrix. The intensity ratio from two reflected Bragg wavelengths is associated with the twist angle of the measured Hi-Bi fiber. It is found that the twist angle resolution is estimated at around 0.3° under ±0.1 dB readout from an optical spectrum analyzer if the polarization state of the light source is stable. The advantages of this new torsion sensor are: (1) insensitivity to intensity variations from the light source, (2) insensitivity to the torsion gauge length, and (3) absolute measurement in the twist angle. However, the polarization state of light in the proposed method needs to be controlled, and any birefringence change in the twisted Hi-Bi fiber needs to be prevented.     

U：CaF2晶体的分凝特性与光谱性质

应用TGT法生长了直径为75mm的U：CaF2晶体，宏观上透明完整.应用公式K0=Cs/Cl计算了U在CaF2晶体中的分凝系数等于0.53.应用溶质分布一般公式Cs=K0C0(1-g)K0-1，计算U的浓度分布与测量值，数值符合说明晶体生长过程接近平衡状态.分析不同条件下生长的U: CaF2晶体的晶胞参数和吸收光谱，结果表明生长气氛决定U的价态及电荷补偿机理：无PbF2存在的条件下，U为+4价，晶体呈绿色；PbF2的加入起到氟化去氧作用，U倾向于以离子半径最接近于Ca2+的U3+存在，晶体呈红色.从晶体生长开始到结束的部位，U3+:CaF2晶体吸收光谱的峰位不变，峰强呈现与U浓度相同的增加趋势.U3+:CaF2晶体外层厚约5mm处呈黄色，含有U3+和U2+的混合价态离子，其原理是石墨坩埚的还原作用通过单质铅，使部分的U3+进一步还原成了U2+. 关键词： 铀 氟化钙晶体 分凝系数 晶胞参数     

Effects of B′-site transition metal on the properties of double perovskites Sr2FeMO6 (M=Mo, W): B′ 4d-5d system

The crystal structure, magnetic and magnetotransport properties of the variation of B′-site transition metal in Sr₂FeMO₆ (M=Mo, W) with double perovskites structure have been investigated systematically. Measurements of magnetization vs. temperature at H=5 T show that Sr₂FeMoO₆ is a ferromagnet and Sr₂FeWO₆ is an antiferromagnet with T_N∼35 K. Additionally, the large magnetoresistance ratio (MR) of ∼22% (H=3 T) at room temperature (RT) was observed in the Sr₂FeWO₆ compound. However, the Sr₂FeMoO₆ compound did not show any significant MR even at high fields and RT (MR∼1%; H=3 T and 300 K). The implications of these findings are supported by band structure calculations to explain the interaction between the 4d(Mo) and 5d(W) orbitals of transition metal ions and oxygen ions.     

High photosensitivity in cis-polyphenylacetylene films irradiated with 60Co γ-ray

This paper reports that ⁶⁰Co γ-ray irradiation can convert cis-polyphenylacetylene (cis-PPA) films prepared with rare-earth coordination catalysts to highly photosensitive materials. The dependence of the photosensitivity on irradiation dose, preparation methods, and microstructure of the PPA films has been investigated by means of a potential discharge technique. The photosensitivity was enhanced with increasing irradiation dose. The critical dose to produce a light response was 5 × 10³ Gy. The maximum surface potential discharge rate was 618 V/s, and the dark decay was approximately 2 V/s for cis-PPA films irradiated with ⁶⁰Co γ-ray (dose: 2 × 10⁵ Gy). The cis-transoidal-PPA and an electrophotographic photoreceptor device incorporating cis-PPA showed a higher irradiation effect. The structure and properties of ⁶⁰Co γ-ray irradiated rare-earth PPA films are similar to the unirradiated films.     

The effects of crystal structure on optical absorption/photoluminescence of bis(8-hydroxyquinoline)zinc

In this paper, the transformation processes of two types of bis(8-hydroxyquinoline)zinc: Znq₂ dihydrate and anhydrous (Znq₂)₄ were investigated by X-ray diffraction (XRD), infrared spectra (IR), scanning electron microscope (SEM), differential scanning calorimetry (DSC) and thermogravimetry (TG). The effects of crystal structure on optical properties of bis(8-hydroxyquinoiline)zinc were analyzed. Znq₂ dihydrate can be transformed into anhydrous (Znq₂)₄ during heating under vacuum. Reversal transformation occurs by the interaction between chloroform and (Znq₂)₄. But (Znq₂)₄ was partially transformed into Znq₂ dihydrate by the interaction between ethanol and (Znq₂)₄. The different molecular structure results in different crystal stacking and electronic structure, thereby affect its optical properties.     

Deposition of Hydrogen-Free Silicon Nitride Thin Films by Microwave ECR plasma Enhanced Magnetron Sputtering at Room Temperature

Hydrogen-free silicon nitride （SiNx） films were deposited at room temperature by microwave electron cyclotron resonance （MW-ECR） plasma enhanced unbalance magnetron sputtering system. Both Fourier-transform infrared spectroscopy and x-ray photoelectron spectroscopy are used to study the bonding type and the change of bonding structures of the silicon nitride films. The results indicate that the chemical structure and composition of SiNx films deposited by this technique depend strongly on the N2 flow rates, the stoichiometric SiNx film, which has the highest hardness of 22.9 GPa, could be obtained at lower N2 flow rate of 4 sccm.